Noise reduction in atomic force microscopy: Resonance contact mode

نویسندگان

  • S. D. O’Connor
  • R. C. Gamble
  • R. K. Eby
  • J. D. Baldeschwieler
چکیده

Noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation ~.200 kHz; ;1 nm! is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system ~50 kHz!. We call this mode ‘‘resonance contact’’ mode. The nonlinear behavior of the tip–sample interaction allows the high frequency excitation to effectively broaden the frequency response of the system resonances. © 1996 American Institute of Physics. @S0034-6748~96!02602-8#

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Gamble mode: Resonance contact mode in atomic force microscopy

Active noise reduction has been accomplished in atomic force microscopy by applying a high frequency, low amplitude vibration to the cantilever while it is in contact with a surface. The applied excitation ~.200 kHz; ;1 nm! is acoustically coupled to the tip and dampens the resonance Q factors of the system. The applied frequency is well above the bandwidth of the acquisition system ~50 kHz!. W...

متن کامل

A simplified but intuitive analytical model for intermittent- contact-mode force microscopy based on Hertzian mechanics

The forces acting on the substrate in intermittent-contact-mode (IC mode, tapping mode) atomic force microscopy are not accessible to a direct measurement. For an estimation of these forces, a simple analytical model is developed by considering only the shift of the cantilever resonance frequency caused by Hertzian (contact) forces. Based on the relationship between frequency shift and tip–samp...

متن کامل

Scanning speed phenomenon in contact-resonance atomic force microscopy

This work presents data confirming the existence of a scan speed related phenomenon in contact-mode atomic force microscopy (AFM). Specifically, contact-resonance spectroscopy is used to interrogate this phenomenon. Above a critical scan speed, a monotonic decrease in the recorded contact-resonance frequency is observed with increasing scan speed. Proper characterization and understanding of th...

متن کامل

Effects of Fluid Environment Properties on the Nonlinear Vibrations of AFM Piezoelectric Microcantilevers

Nowadays, atomic-force microscopy plays a significant role in nanoscience and nanotechnology, and is widely used for direct measurement at atomic scale and scanning the sample surfaces. In tapping mode, the microcantilever of atomic-force microscope is excited at resonance frequency. Therefore, it is important to study its resonance. Moreover, atomic-force microscopes can be operated in fluid e...

متن کامل

Non-contact Friction Force Microscopy Exploiting Lateral Resonance Enhancement

A method for sensing the dissipation occurring when a sharp atomic force microscopy (AFM) tip is oscillated laterally above a surface at distances typical of non-contact mode AFM operation is established and demonstrated. Dissipation is detected by measuring the damping of lateral resonant modes of the AFM cantilever, excited independently after the lateral resonant mode identification, when th...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 1996